OpenThread, Silicon Labs complete interoperability testing
Thread 1.1 tests a device's specification conformance against a blended network composed of four stacks.
Digital PoL converters boost FPGA, processor power
Murata’s OKDx-T/90 digital PoL converter has non-linear transient response that reduces Vout deviation due to large load changes.
On-chip emulator speeds CAN debug
Renesas Electronics’ on-chip E2 Emulator provides connection to the bus that allow message timing to be matched with executing code.
Why India may lose Cricket wafer fab
Dreams of building a multinational wafer fab to boost the semicon industry are gradually slipping away due to concerns over…
Cricket exit poised to be third strike for India
Foreign players are wooing Cricket Semiconductor to build the analog and power pure-play foundry in their region.
Photorelay offers increased density in smaller boards
Toshiba’s TLP3406S photorelay offers small on-resistance and on/off switching currents of 1.5A in 2.00mm x 1.45mm size.
Mitsubishi robot reduces generator inspection time
Mitsubishi Electric has developed a 19.9mm inspection robot that can inspect the gap between the rotor and the stator, reducing…
IoT: Hype or reality?
Microchip's Xavier Bignalet believes that with IoT the question is not one of hype or reality but of when will…
Test serial-data clock jitter via LCC
When testing, use an oscilloscope with sufficient deep memory to capture the lowest-frequency expected to cause problems in the system.
Higher cryptography chip secures future ePassport
Advancements in ePassport’s flexibility, accessibility, security and interoperability allow users to securely derive credentials for other devices.